High-Performances Magnetic ATE Wafer Level probing of Magnetic Devices
Hprobe offers a unique patented technology of multidimensional magnetic field generator for magnetic devices and sensors wafer level characterization and testing. Current product line includes dedicated tools for characterization and testing of MRAM (STT, SOT, VCMA) and Magnetic Sensors (TMR, GMR, etc.) in all phases of the magnetic technology development.
Application
R&D magnetic tech
Probing
Single / Double device up to 4 micro-positioners
Alignment
Manual (3D generator & probes)
Field Calibration
External sensor (manual mount / prober chuck)
Application
R&D magnetic tech, Production WAT
Probing
Single / Double device Probe cards + SACC
Alignment
Auto (3D generator, probes, sensor)
Field Calibation
Embedded sensor
Application
R&D magnetic tech, Production WAT, Production WS
Probing
Chip probing for functional tests with >64 channels and high magnetic field uniformity
Alignment
Auto (3D generator, probes, sensor)
Field Calibration
Embedded sensor
